3GPP FDD User Equipment Receiver Test
The 3GPPFDD_UE_RX is a test bench designed for testing the user equipment receiver in 3GPP FDD systems. It allows users to connect to an RF circuit device under test (DUT) and evaluate its performance through predefined measurements. This test bench facilitates signal assessments for reference sensitivity level, maximum input level, adjacent channel selectivity, and characteristics related to blocking and intermodulation. The measurements and signals are structured in accordance with 3GPP Technical Specifications TS 25.101 and TS 34.121, supporting versions 2000-03, 2000-12, and 2002-03. The 3GPP FDD signal model is compatible with the Agilent E4438C ESG Vector Signal Generator, specifically with Option 400 (3GPP W-CDMA Firmware). The test bench comprises a TX DSP section, an RF modulator, RF output source resistance, an RF DUT connection, RF receivers, and DSP measurement blocks. The generated test signal is directed to the DUT, utilizing the downlink 12.2 kbps reference measurement channel. This includes one 12.2 kbps dedicated transport channel (DTCH) and one 2.4 kbps dedicated control channel (DCCH) multiplexed into a 60 kbps dedicated physical data channel (DPCH). The signal source encompasses one DPCH, one primary common control physical channel (PCCPCH), one primary synchronization channel (PSCH), one secondary synchronization channel (SSCH), one common pilot channel (CPICH), and one page indication channel (PICH). For maximum input level measurement, OCNS interference is calibrated to achieve the necessary DPCH_Ec/I of -19 dB, while maintaining the gain of other channels. An example design template is available within the ADS environment. The following sections detail the setup of the test bench, measurement parameter configurations, simulation display measurements, and baseline performance. Co-simulation occurs between the test bench (utilizing Agilent Ptolemy Data Flow simulation technology) and the DUT (utilizing Agilent Circuit Envelope simulation technology). Each simulation technology necessitates its own time step, with coordination occurring at the interface. The CE_TimeStep defines the Circuit Envelope simulation time step applicable to the DUT and must be set to a value equal to or a submultiple of WTB_TimeStep. If these conditions are not met, the simulation will cease and an error will be generated. The CE_TimeStep is exported to the Choosing Analyses window when the user confirms settings in the Wireless Test Bench Setup window. The WTB_TimeStep is derived from other test bench parameters, with a default of WTB_TimeStep=1/(3.84e6G—8) seconds. This value is displayed in the Data Display pages as TimeStep. Enhanced control over the test bench is achievable through the configuration of Basic Parameters, Signal Parameters, and specific measurement parameters. The RF modulator employs parameters such as FSource, SourcePower, MirrorSourceSpectrum, GainImbalance, PhaseImbalance, I OriginOffset, Q OriginOffset, and IQ Rotation. The RF output resistance is defined by SourceR, SourceTemp, and EnableSourceNoise. The RF output signal source maintains a default output resistance of 50 ohms and operates at the specified frequency (FSource) with the defined source resistance and power. The RF signal may also incorporate additive Gaussian noise, contingent on the resistor temperature and noise enablement. Additional control of the Circuit Envelope simulation can be accomplished through options in the Choosing Analysis window, including enabling Automatic Behavioral Modeling to enhance simulation speed and configuring Circuit Envelope parameters. Simulation results are presented in a Data Display window for each measurement, with detailed descriptions available for each measurement type pertaining to this test bench.
The 3GPPFDD_UE_RX test bench serves as a critical tool in the evaluation of 3GPP FDD user equipment receivers, ensuring compliance with industry standards and facilitating the analysis of various performance metrics. By providing a structured approach to testing, the bench allows engineers to assess the efficacy of RF devices under real-world conditions, thereby contributing to the advancement of telecommunications technology. The integration of advanced simulation techniques, such as co-simulation between different modeling environments, further enhances the accuracy and reliability of the test results. This comprehensive testing framework is essential for the development and optimization of next-generation wireless communication systems.3GPPFDD_UE_RX is the test bench for 3GPP FDD user equipment receiver testing. The test bench provides a way for users to connect to an RF circuit device under test and determine its performance using pre-defined test bench measurements. This test bench provides signal measurements for reference sensitivity level, maximum input level, adjacent chan
nel selectivity, and blocking and intermodulation characteristics. The signal and the measurements are designed according to 3GPP Technical Specifications TS 25. 101 and TS 34. 121. Versions supported are 2000-03, 2000-12, and 2002-03. This 3GPP FDD signal model is compatible with Agilent E4438C ESG Vector Signal Generator, Option 400 (3GPP W-CDMA Firmware Option for the E4438C ESG Vector Signal Generator). Details regarding Agilent E4438C ESG are included at the website. This test bench includes a TX DSP section, an RF modulator, RF output source resistance, an RF DUT connection, RF receivers, and DSP measurement blocks as illustrated in the following figure.
The generated test signal is sent to the DUT. The 3GPPFDD_UE_RX test bench uses the downlink 12. 2kbps reference measurement channel. One 12. 2kbps DTCH (dedicated transport channel) and one 2. 4kbps DCCH (dedicated control channel) are multiplexed into one 60kbps DPCH (dedicated physical data channel). The signal source includes one DPCH, one PCCPCH (primary common control physical channel), one PSCH (primary synchronization channel), one SSCH (secondary synchronization channel), one CPICH (common pilot channel), and one PICH (page indication channel).
For the maximum input level measurement, the OCNS interference is set to the power necessary to achieve the required DPCH_Ec/I or of -19dB. The gain of the other channels remain the same. An example design using this template is available; from the ADS Main window click File > Example Project > WCDMA3G_RF_Verification_prj > 3GPPFDD_UE_RX_test.
dsn. The following sections provide details for setting up a test bench, setting measurement parameters for more control of the test bench, simulation measurement displays, and baseline performance. Cosimulation occurs between the test bench (using Agilent Ptolemy Data Flow simulation technology) and the DUT (using Agilent Circuit Envelope simulation technology).
Each technology requires its own simulation time step with time-step coordination occurring in the interface between the technologies. CE_TimeStep defines the Circuit Envelope simulation time step to be used with this DUT. The CE_TimeStep must be set to a value equal to or a submultiple of (less than) WTB_TimeStep; otherwise, simulation will stop and an error message will be displayed.
The CE_TimeStep value is exported to the Choosing Analyses window in the Circuit Envelope Time Step field when the user clicks OK in the Wireless Test Bench Setup window. Note that WTB_TimeStep is not user-settable. Its value is derived from other test bench parameter values; with default settings WTB_TimeStep=1/(3.
84e6G—8) sec. The value is displayed in the Data Display pages as TimeStep. More control of the test bench can be achieved by setting Basic Parameters, Signal Parameters, and parameters for each measurement. For details refer to Parameter Settings. The RF modulator (shown in the block diagram in Receiver Wireless Test Bench Block Diagram ) uses FSource, SourcePower ( Required Parameters ), MirrorSourceSpectrum ( Basic Parameters), GainImbalance, PhaseImbalance, I OriginOffset, Q OriginOffset, and IQ Rotation ( Signal Parameters ).
The RF output resistance uses SourceR, SourceTemp, and EnableSourceNoise ( Basic Parameters ). The RF output signal source has a 50-ohm (default) output resistance defined by SourceR. RF output (and input to the RF DUT) is at the frequency specified (FSource), with the specified source resistance (SourceR) and with power (SourcePower) delivered into a matched load of resistance SourceR. The RF signal has additive Gaussian noise power set by resistor temperature (SourceTemp) (when EnableSourceNoise=YES).
More control of the Circuit Envelope simulation of the RF DUT is achieved by selecting Options in the Choosing Analysis window. These advanced options include enabling Automatic Behavioral Modeling (which may speed up the RF DUT simulation by over 10X), and setting Circuit Envelope parameters.
Setting these simulations options is described in Setting Automatic Behavioral Modeling Parameters and Setting Circuit Envelope Analysis Parameters in the Wireless Test Bench Simulation documentation. Simulation results will appear in a Data Display window for each measurement. Simulation Measurement Displays describes results for each measurement available for this test bench.
🔗 External reference
The 3GPPFDD_UE_RX test bench serves as a critical tool in the evaluation of 3GPP FDD user equipment receivers, ensuring compliance with industry standards and facilitating the analysis of various performance metrics. By providing a structured approach to testing, the bench allows engineers to assess the efficacy of RF devices under real-world conditions, thereby contributing to the advancement of telecommunications technology. The integration of advanced simulation techniques, such as co-simulation between different modeling environments, further enhances the accuracy and reliability of the test results. This comprehensive testing framework is essential for the development and optimization of next-generation wireless communication systems.3GPPFDD_UE_RX is the test bench for 3GPP FDD user equipment receiver testing. The test bench provides a way for users to connect to an RF circuit device under test and determine its performance using pre-defined test bench measurements. This test bench provides signal measurements for reference sensitivity level, maximum input level, adjacent chan
nel selectivity, and blocking and intermodulation characteristics. The signal and the measurements are designed according to 3GPP Technical Specifications TS 25. 101 and TS 34. 121. Versions supported are 2000-03, 2000-12, and 2002-03. This 3GPP FDD signal model is compatible with Agilent E4438C ESG Vector Signal Generator, Option 400 (3GPP W-CDMA Firmware Option for the E4438C ESG Vector Signal Generator). Details regarding Agilent E4438C ESG are included at the website. This test bench includes a TX DSP section, an RF modulator, RF output source resistance, an RF DUT connection, RF receivers, and DSP measurement blocks as illustrated in the following figure.
The generated test signal is sent to the DUT. The 3GPPFDD_UE_RX test bench uses the downlink 12. 2kbps reference measurement channel. One 12. 2kbps DTCH (dedicated transport channel) and one 2. 4kbps DCCH (dedicated control channel) are multiplexed into one 60kbps DPCH (dedicated physical data channel). The signal source includes one DPCH, one PCCPCH (primary common control physical channel), one PSCH (primary synchronization channel), one SSCH (secondary synchronization channel), one CPICH (common pilot channel), and one PICH (page indication channel).
For the maximum input level measurement, the OCNS interference is set to the power necessary to achieve the required DPCH_Ec/I or of -19dB. The gain of the other channels remain the same. An example design using this template is available; from the ADS Main window click File > Example Project > WCDMA3G_RF_Verification_prj > 3GPPFDD_UE_RX_test.
dsn. The following sections provide details for setting up a test bench, setting measurement parameters for more control of the test bench, simulation measurement displays, and baseline performance. Cosimulation occurs between the test bench (using Agilent Ptolemy Data Flow simulation technology) and the DUT (using Agilent Circuit Envelope simulation technology).
Each technology requires its own simulation time step with time-step coordination occurring in the interface between the technologies. CE_TimeStep defines the Circuit Envelope simulation time step to be used with this DUT. The CE_TimeStep must be set to a value equal to or a submultiple of (less than) WTB_TimeStep; otherwise, simulation will stop and an error message will be displayed.
The CE_TimeStep value is exported to the Choosing Analyses window in the Circuit Envelope Time Step field when the user clicks OK in the Wireless Test Bench Setup window. Note that WTB_TimeStep is not user-settable. Its value is derived from other test bench parameter values; with default settings WTB_TimeStep=1/(3.
84e6G—8) sec. The value is displayed in the Data Display pages as TimeStep. More control of the test bench can be achieved by setting Basic Parameters, Signal Parameters, and parameters for each measurement. For details refer to Parameter Settings. The RF modulator (shown in the block diagram in Receiver Wireless Test Bench Block Diagram ) uses FSource, SourcePower ( Required Parameters ), MirrorSourceSpectrum ( Basic Parameters), GainImbalance, PhaseImbalance, I OriginOffset, Q OriginOffset, and IQ Rotation ( Signal Parameters ).
The RF output resistance uses SourceR, SourceTemp, and EnableSourceNoise ( Basic Parameters ). The RF output signal source has a 50-ohm (default) output resistance defined by SourceR. RF output (and input to the RF DUT) is at the frequency specified (FSource), with the specified source resistance (SourceR) and with power (SourcePower) delivered into a matched load of resistance SourceR. The RF signal has additive Gaussian noise power set by resistor temperature (SourceTemp) (when EnableSourceNoise=YES).
More control of the Circuit Envelope simulation of the RF DUT is achieved by selecting Options in the Choosing Analysis window. These advanced options include enabling Automatic Behavioral Modeling (which may speed up the RF DUT simulation by over 10X), and setting Circuit Envelope parameters.
Setting these simulations options is described in Setting Automatic Behavioral Modeling Parameters and Setting Circuit Envelope Analysis Parameters in the Wireless Test Bench Simulation documentation. Simulation results will appear in a Data Display window for each measurement. Simulation Measurement Displays describes results for each measurement available for this test bench.
🔗 External reference
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