4093 Quad 2-Input NAND Schmitt Trigger

Overview

The HCC4093B (extended temperature range) and HCF4093B (intermediate temperature range) are monolithic integrated circuits fabricated in Metal Oxide Semiconductor technology. These devices belong to the "B" series of CMOS devices and provide four independent 2-input NAND Schmitt trigger gates in a single package. The Schmitt trigger action on each input transforms slowly changing input signals into sharply defined, jitter-free output signals.

These devices find applications in wave and pulse shapers, high-noise environment circuits, and as monostable multivibrators. The 4093 is available in multiple package options to suit various application requirements.

Key Features

• Quad 2-input NAND Schmitt trigger gates in single package
• Schmitt trigger hysteresis for noise immunity
• Standardized symmetrical output characteristics
• 100% tested for quiescent current at 20V
• 5V, 10V, and 15V parametric ratings
• Maximum input current of 1µA at 18V over full temperature range
• Noise margin (full package temperature range) = 1V at VDD = 5V, 2V at VDD = 10V, 2.5V at VDD = 15V
• Meets all requirements of JEDEC Tentative Standard No. 13B, "Standard Specifications for Description of 'B' Series CMOS Devices"

Applications

• Wave and pulse shapers
• Noise immunity circuits in high-noise environments
• Monostable multivibrators
• Signal conditioning circuits
• Level detection with hysteresis
• Contact bounce elimination
• Threshold detection circuits

Electrical Characteristics

Absolute Maximum Ratings

• Supply Voltage (VDD): -0.5V to +22V
• Input Voltage (VIN): -0.5V to VDD + 0.5V
• Storage Temperature Range: -65°C to +150°C
• Power Dissipation per Package: 200mW
• Power Dissipation per Output Transistor: 100mW

Recommended Operating Conditions

• Supply Voltage Range (VDD): 3V to 18V
• Input Voltage Range (VIN): 0V to VDD
• Operating Temperature Range:
  • HCC4093B: -55°C to +125°C
  • HCF4093B: -40°C to +85°C

DC Electrical Characteristics

• High Level Output Voltage (VOH): VDD - 0.1V (min) at VDD = 10V, IOH = -0.4mA
• Low Level Output Voltage (VOL): 0.1V (max) at VDD = 10V, IOL = 0.4mA
• Input Leakage Current (IIN): ±0.1µA (max) at VDD = 18V, TA = 25°C
• Quiescent Device Current (IDD): 1µA (max) at VDD = 18V, TA = 25°C

AC Electrical Characteristics

• Propagation Delay Time (tPHL, tPLH): 150ns (typ) at VDD = 10V, CL = 50pF, TA = 25°C
• Transition Time (tTHL, tTLH): 100ns (typ) at VDD = 10V, CL = 50pF, TA = 25°C
• Input Capacitance (CIN): 7.5pF (max) at VDD = 5V, TA = 25°C

Schmitt Trigger Characteristics

• Positive-going Threshold Voltage (VT+): 6.3V (typ) at VDD = 10V, TA = 25°C
• Negative-going Threshold Voltage (VT-): 3.7V (typ) at VDD = 10V, TA = 25°C
• Hysteresis Voltage (VT+ - VT-): 2.6V (typ) at VDD = 10V, TA = 25°C

Package Information

Available Packages

• 14-lead Dual In-line Plastic Package (HCF4093BEY)
• 14-lead Dual In-line Ceramic Frit Seal Package (HCF4093BF)
• 14-lead Plastic Chip Carrier (HCF4093BC1)
• 14-lead Micro Package (HCF4093BM1)

Package Dimensions

• Dual In-line Plastic Package:
  • Body Length: 19.30mm (max)
  • Body Width: 6.60mm (max)
  • Lead Pitch: 2.54mm
• Ceramic Frit Seal Package:
  • Body Length: 19.94mm (max)
  • Body Width: 7.62mm (max)
  • Lead Pitch: 2.54mm

Functional Description

The 4093 consists of four independent 2-input NAND gates with Schmitt trigger inputs. Each gate performs the Boolean function Y = A • B in positive logic. The Schmitt trigger input characteristic provides hysteresis which makes the device particularly useful for transforming slowly changing input signals into sharply defined, jitter-free output signals.

The input hysteresis allows the device to be used as an oscillator when a capacitor and resistor are connected between input and output. The hysteresis also provides improved noise immunity compared to standard logic gates, making the 4093 ideal for applications where input signals may be noisy or slowly transitioning.

Handling and Storage Precautions

• CMOS devices have high input impedance and are susceptible to electrostatic discharge (ESD). Proper ESD precautions should be taken during handling and assembly.
• Unused inputs must always be tied to an appropriate logic level (either VDD or VSS).
• Storage should be in anti-static containers in a controlled environment.
• When soldering, follow standard CMOS handling procedures to prevent damage from static electricity.

Ordering Information

• HCC4093BF: Ceramic Frit Seal Package, Extended Temperature Range
• HCF4093BM1: Micro Package, Intermediate Temperature Range
• HCF4093BEY: Plastic Dual In-line Package, Intermediate Temperature Range
• HCF4093BC1: Plastic Chip Carrier, Intermediate Temperature Range