Unijunction Transistor

1. Definition and Basic Structure

1.1 Definition and Basic Structure

A unijunction transistor (UJT) is a three-terminal semiconductor device with a unique negative resistance characteristic, primarily used in relaxation oscillators, timing circuits, and thyristor triggering applications. Unlike conventional bipolar junction transistors (BJTs) or field-effect transistors (FETs), the UJT consists of a single p-n junction but exhibits switching behavior due to its internal structure and doping profile.

Structural Composition

The UJT comprises:

E B1 B2

Operating Principle

The intrinsic standoff ratio (η) defines the voltage division between B1 and B2 before emitter current flows:

$$ \eta = \frac{R_{B1}}{R_{B1} + R_{B2}} $$

where RB1 and RB2 are the resistances from the emitter junction to B1 and B2, respectively. When the emitter voltage VE exceeds ηVBB + VD (where VD is the junction forward voltage), the device enters negative resistance region.

Key Electrical Characteristics

Fabrication and Material Properties

Modern UJTs use silicon with aluminum or gold doping for the emitter. The n-type base region is typically doped at 1015–1016 atoms/cm3 to achieve optimal standoff ratio and switching speed. Early versions (e.g., General Electric 2N2646) employed alloy-diffused junctions, while contemporary designs use planar epitaxial growth for better parameter control.

1.2 Key Characteristics and Symbol

Electrical Behavior and Symbol

The unijunction transistor (UJT) is a three-terminal semiconductor device with a unique negative resistance characteristic, primarily used in relaxation oscillators and timing circuits. Its symbol consists of an emitter (E) and two base terminals (B1 and B2), represented as an arrow pointing into a bar, distinguishing it from conventional bipolar transistors.

E B1 B2

Intrinsic Standoff Ratio (η)

The intrinsic standoff ratio (η) is a fundamental parameter defining the UJT's switching behavior. It represents the voltage divider ratio between B1 and B2 when the emitter is open-circuited:

$$ \eta = \frac{R_{B1}}{R_{BB}} $$

where RBB is the total interbase resistance (RB1 + RB2). Typical values range from 0.5 to 0.8, determining the emitter voltage at which the device triggers.

Negative Resistance Region

When the emitter voltage (VE) exceeds the peak point voltage (VP = ηVBB + VD, where VD is the diode drop), the UJT enters negative resistance mode. This causes a rapid decrease in emitter-base1 resistance, enabling its use in pulse generation.

$$ V_P = \eta V_{BB} + 0.7V $$

Practical Applications

Comparison with Conventional Transistors

Unlike bipolar junction transistors (BJTs), UJTs:

UJT Relaxation Oscillator Waveforms Waveform diagram showing the emitter voltage (V_E) sawtooth and B1 trigger pulse of a UJT relaxation oscillator, with labeled peak (V_P) and valley (V_V) points. Time V_E B1 V_P V_V R_C Discharge Emitter Voltage (V_E) B1 Output Pulse
Diagram Description: The negative resistance region and relaxation oscillator operation are highly visual concepts that require waveform illustration to show the voltage transitions and timing behavior.

1.3 Comparison with Bipolar Junction Transistors (BJTs)

Unijunction transistors (UJTs) and bipolar junction transistors (BJTs) serve fundamentally different roles in electronic circuits, despite their structural similarities. While BJTs are primarily used for amplification and switching, UJTs are specialized for relaxation oscillators, timing circuits, and pulse generation. The key differences arise from their operational principles, terminal behavior, and transfer characteristics.

Structural and Operational Differences

A BJT consists of three doped semiconductor regions (emitter, base, collector) forming two p-n junctions, whereas a UJT has a single p-n junction with three terminals: emitter (E), base 1 (B1), and base 2 (B2). The intrinsic standoff ratio (η) of a UJT, defined as the ratio of the resistance between the emitter and B1 to the total interbase resistance, governs its negative resistance behavior. In contrast, a BJT operates based on minority carrier injection and diffusion, with its current gain (β) determined by doping concentrations and physical dimensions.

$$ \eta = \frac{R_{B1}}{R_{B1} + R_{B2}} $$

Current-Voltage Characteristics

The UJT exhibits a negative resistance region in its emitter characteristic curve, enabling its use in oscillators. Once the emitter voltage exceeds the peak point voltage (VP), the UJT enters a low-resistance state, discharging the emitter junction capacitance. A BJT, however, maintains a positive resistance relationship between collector current and collector-emitter voltage in its active region, following the Ebers-Moll model:

$$ I_C = I_S \left( e^{\frac{V_{BE}}{V_T}} - 1 \right) $$

Switching Behavior

UJTs are inherently suited for fast switching applications due to their negative differential resistance, allowing rapid transitions between high and low impedance states. BJTs, while capable of switching, require careful biasing to avoid saturation delays. The UJT's switching time is primarily determined by the RC time constant of the external timing network, whereas a BJT's switching speed depends on charge storage effects and the Miller capacitance.

Applications and Practical Considerations

UJTs are predominantly used in:

BJTs, on the other hand, are versatile in:

The temperature stability of UJTs is generally inferior to BJTs due to their dependency on the intrinsic standoff ratio, which varies with temperature. BJTs benefit from well-established compensation techniques, such as emitter degeneration resistors, to stabilize operating points.

UJT vs BJT Structure and Characteristics Side-by-side comparison of Unijunction Transistor (UJT) and Bipolar Junction Transistor (BJT) structures with their corresponding current-voltage (IV) characteristic curves. UJT vs BJT Structure and Characteristics E B1 B2 N-type P-type Emitter C E B NPN Layers I (A) V (V) Vp Negative Resistance UJT Characteristics I (A) V (V) Active Region BJT Characteristics UJT (Blue) BJT (Green)
Diagram Description: The section compares structural differences and current-voltage characteristics between UJTs and BJTs, which are highly visual concepts.

2. Intrinsic Standoff Ratio

Intrinsic Standoff Ratio

The intrinsic standoff ratio (η) is a fundamental parameter governing the switching behavior of a unijunction transistor (UJT). It represents the voltage divider ratio between the emitter and base 1 when the emitter is open-circuited. Mathematically, it is defined as:

$$ η = \frac{R_{B1}}{R_{BB}} $$

where RB1 is the resistance between the emitter and base 1, and RBB is the total interbase resistance (RB1 + RB2). The standoff ratio typically ranges from 0.5 to 0.8 for commercial UJTs, determined by the device's physical geometry and doping profile.

Derivation and Physical Interpretation

The standoff ratio arises from the resistive voltage divider formed by the UJT’s internal structure. When no emitter current flows, the voltage at the emitter junction (VE) is a fraction of the interbase voltage (VBB):

$$ V_E = η V_{BB} $$

This voltage must be exceeded by the emitter voltage (VE) to forward-bias the p-n junction and trigger the UJT into conduction. The standoff ratio is temperature-dependent due to the semiconductor material's resistivity variations, often requiring compensation in precision timing circuits.

Practical Implications

In oscillator and pulse generator circuits, η directly influences the firing threshold and frequency stability. For example, in a relaxation oscillator, the time constant (τ) is:

$$ τ = RC \ln\left(\frac{1}{1 - η}\right) $$

where R and C are the external timing components. A higher η reduces the charging time, increasing oscillation frequency. Manufacturers specify η with tight tolerances (e.g., ±5%) for predictable performance.

Measurement Techniques

To experimentally determine η, apply a fixed VBB and measure the peak-point voltage (VP) at the emitter:

$$ η = \frac{V_P - V_D}{V_{BB}} $$

where VD (~0.7 V) is the diode forward voltage drop. Curve tracers or parameter analyzers automate this measurement by sweeping VBB and recording the turn-on threshold.

UJT Internal Structure and Standoff Ratio Schematic diagram of a Unijunction Transistor (UJT) showing internal resistances RB1 and RB2, emitter junction, and voltage labels to illustrate the standoff ratio (η). Emitter (E) Base 2 (B2) Base 1 (B1) RB2 RB1 η = RB1 / (RB1 + RB2) VE VBB RBB = RB1 + RB2
Diagram Description: The diagram would show the UJT's internal resistive voltage divider structure and its relationship to the standoff ratio.

2.2 Negative Resistance Region

The negative resistance region of a Unijunction Transistor (UJT) is a critical operating regime where an increase in emitter current (IE) results in a decrease in emitter voltage (VE). This phenomenon arises due to the intrinsic conductivity modulation within the N-type channel between base terminals B1 and B2.

Mechanism of Negative Resistance

When the emitter voltage (VE) exceeds the intrinsic standoff voltage (VP), the PN junction becomes forward-biased, injecting holes into the N-type region. This injection reduces the effective resistance between the emitter and B1, leading to a regenerative process:

$$ \frac{dV_E}{dI_E} < 0 $$

The negative slope in the V-I characteristic is governed by the UJT's intrinsic parameters:

$$ V_P = \eta V_{BB} + V_D $$

where η (intrinsic standoff ratio) and VD (diode forward voltage) dictate the peak point voltage (VP). Beyond VP, the device enters the negative resistance region.

Mathematical Derivation of Negative Resistance

The dynamic resistance (rd) in the negative resistance region is derived from the emitter current equation:

$$ I_E = I_{ES} \left( e^{\frac{V_E}{nV_T}} - 1 \right) $$

Differentiating with respect to VE yields:

$$ \frac{dI_E}{dV_E} = \frac{I_{ES}}{nV_T} e^{\frac{V_E}{nV_T}} $$

Since rd = dVE/dIE, the negative resistance condition emerges when the exponential term dominates:

$$ r_d = -\frac{nV_T}{I_E} $$

Practical Implications

This region enables UJTs to function in:

The negative resistance property is exploited in timing circuits, where the UJT's switching speed is determined by the RC time constant and the device's negative resistance slope.

2.3 Triggering Mechanism and Switching Behavior

Intrinsic Standoff Ratio and Triggering

The triggering mechanism of a unijunction transistor (UJT) is governed by its intrinsic standoff ratio (η), defined as the ratio of the emitter-base 1 (B1) resistance to the total interbase resistance (RBB):

$$ \eta = \frac{R_{B1}}{R_{BB}} $$

When the emitter voltage (VE) exceeds the sum of the voltage drop across RB1 and the diode forward voltage (VD ≈ 0.7 V for silicon), the UJT triggers. This condition is expressed as:

$$ V_E \geq \eta V_{BB} + V_D $$

where VBB is the interbase voltage. Once triggered, the UJT enters a negative resistance region, enabling rapid switching.

Negative Resistance and Switching Dynamics

Post-triggering, the UJT exhibits negative resistance behavior, where an increase in emitter current (IE) reduces the voltage drop across the emitter-base junction. This is due to hole injection from the emitter into the lightly doped N-type bar, modulating the conductivity of RB1.

The switching time (ts) is determined by the time constant of the emitter circuit:

$$ t_s \approx R_E C_E \ln\left(\frac{V_{BB} - V_V}{V_{BB} - V_P}\right) $$

where:

Practical Applications

The UJT's predictable triggering and negative resistance make it ideal for:

Mathematical Derivation of Peak-Point Voltage

The peak-point voltage (VP) is derived from the voltage divider action and diode drop:

$$ V_P = \eta V_{BB} + V_D $$

For a UJT with η = 0.6 and VBB = 12 V:

$$ V_P = 0.6 \times 12 + 0.7 = 7.9 \text{ V} $$

Switching Waveforms

The emitter voltage waveform during oscillation shows distinct phases:

  1. Charging phase: VE rises exponentially toward VP.
  2. Discharging phase: After triggering, VE collapses to VV (typically 2–3 V).
  3. Recovery phase: The UJT resets as IE falls below the valley current (IV).
VP VV Time VE

3. Relaxation Oscillators

3.1 Relaxation Oscillators

Operating Principle

A relaxation oscillator built with a unijunction transistor (UJT) exploits the negative resistance region of the UJT's emitter characteristic to generate non-sinusoidal oscillations. The circuit consists of a UJT, a capacitor (C), and a resistor (R) connected in a feedback loop. When the capacitor charges through R to the UJT's peak point voltage (VP), the UJT triggers, discharging the capacitor rapidly until the emitter voltage falls below the valley point voltage (VV). The cycle then repeats, producing a sawtooth waveform across the capacitor and a pulse train at the UJT's base terminals.

Mathematical Analysis

The oscillation frequency is determined by the RC time constant and the intrinsic standoff ratio (η) of the UJT. The standoff ratio is defined as:

$$ \eta = \frac{R_{B1}}{R_{B1} + R_{B2}} $$

where RB1 and RB2 are the interbase resistances. The peak point voltage is given by:

$$ V_P = \eta V_{BB} + V_D $$

where VBB is the interbase voltage and VD (~0.7 V) is the emitter diode forward voltage drop. The time period (T) of oscillation is derived from the exponential charging of the capacitor:

$$ T = RC \ln \left( \frac{V_{BB} - V_V}{V_{BB} - V_P} \right) $$

For practical purposes, if VV is negligible compared to VBB, the formula simplifies to:

$$ f \approx \frac{1}{RC \ln \left( \frac{1}{1 - \eta} \right)} $$

Circuit Design Considerations

Practical Applications

UJT relaxation oscillators are widely used in:

Stability and Limitations

Temperature sensitivity of VD and η can affect frequency stability. For precision applications, a complementary circuit with a programmable UJT (PUT) or a dedicated timer IC (e.g., 555) is preferred. The UJT oscillator's nonlinearity also limits its use to low-frequency applications (typically <100 kHz).

UJT Relaxation Oscillator UJT C R
UJT Relaxation Oscillator Circuit and Waveforms A schematic of a UJT relaxation oscillator circuit with corresponding sawtooth and pulse waveforms showing emitter voltage and base outputs. V_BB R C B2 (R_B2) B1 (R_B1) E Emitter Voltage (V_E) V_P V_V ηV_BB Base Output (V_B1) Time (t)
Diagram Description: The diagram would physically show the UJT relaxation oscillator circuit layout and the sawtooth/pulse waveforms generated across the capacitor and base terminals.

3.2 Pulse Generators

The unijunction transistor (UJT) is particularly well-suited for generating sharp, repetitive pulses due to its negative resistance characteristic. When configured in a relaxation oscillator circuit, it produces a sawtooth waveform at the emitter terminal and short-duration pulses at the base terminals. The timing of these pulses is governed by the RC time constant and the intrinsic standoff ratio (η) of the UJT.

Basic UJT Relaxation Oscillator

A standard UJT pulse generator consists of:

When power is applied, CE charges exponentially through RE until the emitter voltage reaches the UJT's peak point voltage (VP). The UJT then triggers, discharging CE rapidly through B1, producing a voltage spike across RB1. The cycle repeats, generating a train of pulses.

Mathematical Analysis

The pulse repetition frequency (f) is determined by:

$$ f = \frac{1}{T} = \frac{1}{R_E C_E \ln\left(\frac{1}{1 - η}\right)} $$

where:

The pulse width (tp) depends on the discharge time constant:

$$ t_p \approx R_{B1} C_E $$

Design Considerations

For reliable oscillation:

$$ R_{E(min)} = \frac{V_{BB} - V_P}{I_P}, \quad R_{E(max)} = \frac{V_{BB} - V_V}{I_V} $$

Here, IP (peak current) and IV (valley current) are UJT-specific parameters.

Practical Applications

UJT pulse generators are widely used in:

Stability Enhancements

Temperature stability can be improved by:

VBB RB1 RB2 RE CE
UJT Relaxation Oscillator Circuit and Waveforms A schematic of a UJT relaxation oscillator circuit with corresponding sawtooth and pulse waveforms. VBB GND RB2 B2 B1 RB1 RE CE Emitter η (intrinsic standoff ratio) VP (peak point voltage) Time Voltage Emitter Voltage (Sawtooth) VP Sawtooth slope RB1 Voltage (Pulse) Pulse spikes
Diagram Description: The diagram would physically show the UJT relaxation oscillator circuit layout with component connections and the sawtooth/pulse waveforms at key nodes.

3.3 Timing Circuits

The unijunction transistor (UJT) is particularly well-suited for timing applications due to its negative resistance region and predictable firing characteristics. When configured in a relaxation oscillator circuit, the UJT generates precise time delays determined by the RC time constant and the intrinsic standoff ratio (η).

Basic Relaxation Oscillator Operation

A UJT relaxation oscillator consists of a UJT, a capacitor (C), and a resistor (R) connected to the emitter. The capacitor charges exponentially through R until the emitter voltage reaches the UJT's peak point voltage (VP), triggering the UJT into conduction. The capacitor then discharges rapidly through the UJT's low-impedance path until the emitter voltage drops to the valley point voltage (VV), resetting the cycle.

$$ V_P = η V_{BB} + V_D $$

where η is the standoff ratio (typically 0.5–0.8), VBB is the interbase voltage, and VD is the diode forward voltage (~0.7 V).

Derivation of Timing Period

The time period (T) of the oscillator is dominated by the charging phase of the capacitor. The charging voltage across C follows:

$$ v_C(t) = V_{BB} (1 - e^{-t/RC}) $$

The UJT fires when vC(t) = VP. Substituting and solving for t:

$$ T = RC \ln \left( \frac{1}{1 - η} \right) $$

For practical designs, the discharge time is negligible compared to the charging time, making this approximation valid.

Practical Design Considerations

$$ \frac{V_{BB} - V_V}{I_V} < R < \frac{V_{BB} - V_P}{I_P} $$

where IV and IP are the valley and peak currents, respectively.

Applications in Pulse Generation

UJT timing circuits are widely used in:

Example: 10 Hz Oscillator Design

Given η = 0.6, VBB = 12 V, and C = 1 μF, calculate R for a 10 Hz output:

$$ T = \frac{1}{10} = 0.1 \text{ s} $$ $$ R = \frac{T}{C \ln \left( \frac{1}{1 - η} \right)} = \frac{0.1}{10^{-6} \ln(2.5)} ≈ 91 \text{ kΩ} $$
UJT Relaxation Oscillator Circuit and Waveforms A schematic of a Unijunction Transistor (UJT) relaxation oscillator circuit with corresponding capacitor voltage and output pulse waveforms. V_BB R η C Time V Capacitor Voltage V_P V_V Output Pulse Time V UJT Relaxation Oscillator Circuit Schematic Waveforms Charging curve Discharge pulse
Diagram Description: The section describes a relaxation oscillator circuit with time-dependent capacitor charging/discharging behavior, which is highly visual.

4. Temperature Effects

4.1 Temperature Effects

The performance of a unijunction transistor (UJT) is highly sensitive to temperature variations due to its intrinsic semiconductor properties. The primary parameters affected include the intrinsic standoff ratio (η), peak-point voltage (VP), and valley current (IV). These variations arise from changes in carrier mobility, bandgap energy, and junction leakage currents.

Thermal Dependence of Intrinsic Standoff Ratio (η)

The intrinsic standoff ratio is given by:

$$ η = \frac{R_{B1}}{R_{B1} + R_{B2}} $$

where RB1 and RB2 are the resistances of the two base regions. As temperature increases, the resistivity of the lightly doped N-type silicon bar decreases due to increased carrier concentration. This results in a reduction of η by approximately 0.1% per °C for typical UJTs.

Peak-Point Voltage (VP) Variation

The peak-point voltage is expressed as:

$$ V_P = η V_{BB} + V_D $$

where VBB is the interbase voltage and VD is the forward diode drop (≈0.7 V for silicon). Since both η and VD are temperature-dependent, VP exhibits a negative temperature coefficient. Empirical studies show a linear decrease of 2–3 mV/°C in VP for commercial UJTs.

Valley Current (IV) and Negative Resistance Region

The valley current increases exponentially with temperature due to enhanced minority carrier injection and reduced potential barrier height. The relationship can be modeled using the Shockley diode equation:

$$ I_V = I_S \left( e^{\frac{q V}{n k T}} - 1 \right) $$

where IS is the reverse saturation current, n is the ideality factor, and k is Boltzmann’s constant. At elevated temperatures, the UJT may fail to exhibit a stable negative resistance region, leading to erratic triggering in relaxation oscillators.

Practical Mitigation Techniques

In precision timing applications, such as pulse generators, these effects necessitate careful thermal management or alternative switching devices like programmable UJTs (PUTs) with externally adjustable parameters.

4.2 Voltage and Current Ratings

Critical Operating Limits

The unijunction transistor's performance and reliability are governed by its voltage and current ratings, which define safe operating boundaries. Exceeding these limits can lead to thermal runaway or permanent damage. Key parameters include:

Mathematical Derivation of Standoff Ratio

The intrinsic standoff ratio (η), a unique UJT parameter, determines the voltage division between bases before emitter conduction begins. For a UJT with interbase resistance RBB and internal resistances RB1 and RB2:

$$ \eta = \frac{R_{B1}}{R_{B1} + R_{B2}} $$

The emitter firing voltage (VP) is derived from η and the interbase voltage:

$$ V_P = \eta V_{BB} + V_D $$

where VD is the emitter diode's forward voltage drop (~0.7 V for silicon).

Power Dissipation Constraints

The UJT's average power dissipation (PD(max)) must not exceed manufacturer specifications (typically 300–500 mW). For pulsed operation, the instantaneous power during conduction is:

$$ P_{inst} = V_{E(sat)} \cdot I_{E(peak)} $$

where VE(sat) is the emitter saturation voltage (~2–3 V). Thermal derating curves must be consulted for high-temperature environments.

Practical Design Considerations

In relaxation oscillator applications, the timing resistor (RE) must satisfy:

$$ \frac{V_{BB} - V_P}{I_P} < R_E < \frac{V_{BB} - V_V}{I_V} $$

where IP is the peak point current (µA range) and IV is the valley current. Exceeding these bounds prevents oscillation or causes latch-up.

B2 B1 E

4.3 Common Failure Modes

Thermal Runaway and Overheating

Unijunction transistors (UJTs) are susceptible to thermal runaway due to their negative temperature coefficient of resistance in the emitter-base region. As temperature rises, the intrinsic standoff ratio (η) decreases, leading to higher emitter current density and further heating. If unchecked, this positive feedback loop can cause permanent degradation of the emitter-base junction. In high-power applications, inadequate heat sinking exacerbates the issue, accelerating failure.

$$ \eta(T) = \eta_0 - \alpha (T - T_0) $$

where α is the temperature coefficient (typically -0.2%/°C for silicon UJTs).

Emitter-Base Junction Degradation

Repeated triggering cycles cause localized hot spots at the emitter-base junction, leading to:

Interbase Resistance Drift

The interbase resistance (RBB) exhibits long-term drift due to:

This drift impacts timing accuracy in relaxation oscillators, where the period Ï„ depends on RBB:

$$ \tau = R_1 C \ln\left(\frac{1}{1-\eta}\right) $$

Gate Oxide Breakdown in Programmable UJTs (PUTs)

Programmable UJTs (e.g., 2N6027) suffer from gate oxide breakdown when:

Catastrophic Failure from Overvoltage

Exceeding the peak reverse voltage (VEB2R) causes avalanche breakdown in the emitter-base junction. This often manifests as:

Mitigation Strategies

5. Recommended Books and Papers

5.1 Recommended Books and Papers

5.2 Online Resources and Datasheets

5.3 Historical Context and Development